Sensors and Electron Devices Directorate Research Areas

Nanoelectronic Materials and Devices

Advisor: Ervin, Matthew H. (matthew.ervin@us.army.mil 301-394-0017)

Keywords: Carbon nanotubes; Nanowires; Scanning electron microscopy; Nanomanipulation; Electrical characterization; Sensors; High-speed devices

A variety of inorganic nanowires, organic nanofibers, and carbon nanotubes (CNTs) are being investigated for potential application as active elements in sensors and high-speed devices. Structural, chemical, and electronic characterization of these materials is being performed using various techniques. A Hitachi field emission SEM and a VEECO NanoMan V atomic force microscope are used for physical characterization. Electrical characterization is performed using a Keithley 4200 semiconductor characterization system with a cryogenic vacuum probe station. Other facilities include CNT growth furnaces, a focused ion beam tool, an electron beam lithography system, a fully equipped cleanroom, and significant materials characterization assets throughout the organization.

Research opportunities in nanoelectronics consist of investigations in the following areas: electrical contacts to nanowires/CNTs, electrical transport phenomena in nanophase materials, characterization methodologies, nanomaterial growth, device assembly, and device integration. One area of particular interest is how to improve the selectivity of CNT field effect transistor based sensors to chem/bio agents. Internal research is in progress in these areas, in direct collaboration with universities and industry.